Author
American Society for Testing and Materials
6
Andronov, I. V. (Ivan V.)
4
Institution of Electrical Engineers
4
International Seminar Day on Diffraction Saint Petersburg, Russia
4
Ufimtsev, Pyotr Yakovlevich
3
American Society for Testing and Materials. Committee E-4 on Metallography
2
American Society for Testing and Materials. Subcommittee 11 on Electron Microscopy and Diffraction
2
IEEE ED/MTT/AP St. Petersburg Chapter
2
Institution of Engineering and Technology
2
Rossiiskaia akademiia nauk
2
Rossiiskii fond fundamentalnykh issledovanii
2
ASTM Committee E-4 on Metallography. Subcommittee XI on Electron Microstructure of Metals
1
ASTM Subcommittee F01.02 on Lasers
1
American Society for Testing and Materials. Meeting
1
American Society for Testing and Materials. Subcommittee 14 on Quantitative Metallography
1
American Society for Testing and Materials. Subcommittee 15 on Scanning Microscopy and Microprobe Analysis
1
Borovikov, V. A.
1
Bouché, Daniel, 1958-
1
Claeys, Gregory
1
Croisille, Jean-Pierre, 1961-
1
De Graef, Marc
1
Dyson, D. J. (David John)
1
Felsen, Leopold B.
1
Guenther, Arthur Henry, 1931-
1
Hammond, C. (Christopher), 1942-
1
He, Bob B., 1954-
1
IEEE Xplore (Online service)
1
Ilyinski, A. S.
1
Institute of Materials, Minerals, and Mining
1
International Union of Crystallography
1
JCPDS--International Centre for Diffraction Data
1
James, Graeme L.
1
Jull, E. V.
1
Kinber, B. Ye., 1922-1991
1
Lebeau, Gilles
1
Leskova, Tamara A.
1
Liebenberg, D. H.
1
Lyalinov, Mikhail A.
1
Maniar, G. N.
1
Maradudin, A. A.
1
Marcuvitz, Nathan
1
McHenry, Michael E.
1
Mittemeijer, E. J.
1
Mndez, Eugenio R.
1
Molinet, Frédéric
1
Murphy, Bridget
1
Pellissier, G. E.
1
Purdy, S. M.
1
Rutgers University. College of Engineering
1
Schwartz, Adam J.
1
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