Author
Hong Kong University of Science and Technology
Beijing da xue
1
Chinese University of Hong Kong
1
City University of Hong Kong
1
Dian zi ke ji da xue (Chengdu, China)
1
Guilin dian zi ke ji da xue
1
IEEE Computer Society. Technical Council on Test Technology
1
IEEE Hong Kong Section Electron Devices Society
1
IEEE International Workshop on Electronic Design, Test and Applications Hong Kong, China
1
Institute of Electrical and Electronics Engineers
1
International Association for Chinese Management Research
1
International Conference on Communications, Circuits, and Systems Xiamen University
1
National Instruments (Firm)
1
Osseiran, Adam
1
Xiamen da xue
1