Towards modelling realistic ageing rates of amorphous silicon devices in operational environments

This paper presents a method to de-convolute the annealing and degradation processes of amorphous silicon devices. This will allow modelling realistic outdoor operation. Six devices underwent 14000 hours indoor light exposure at different and varying thermal conditions. The devices are exposed to li...

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Bibliographic Details
Main Authors: Jiang Zhu, Martin Bliss, Tom Betts, Ralph Gottschalg
Format: Default Conference proceeding
Published: 2015
Subjects:
Online Access:https://hdl.handle.net/2134/37786
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