Interfacial surface roughness determination by coherence scanning interferometry using noise compensation

The capability of coherence scanning interferometry has been extended recently to include the determination of the interfacial surface roughness between a thin film and a substrate when the surface perturbations are less than ∼10  nm∼10  nm in magnitude. The technique relies on introducing a first-o...

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Bibliographic Details
Main Authors: Hiro Yoshino, Michael Walls, Roger Smith
Format: Default Article
Published: 2017
Subjects:
Online Access:https://hdl.handle.net/2134/25292
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