Gao, F., Leach, R. K., Petzing, J., & Coupland, J. (2008). Surface measurement errors using commercial scanning white light interferometers.
Chicago Edition CitationGao, F., Richard K. Leach, Jon Petzing, and Jeremy Coupland. Surface Measurement Errors Using Commercial Scanning White Light Interferometers. 2008.
MLA Edition CitationGao, F., et al. Surface Measurement Errors Using Commercial Scanning White Light Interferometers. 2008.
Warning: These citations may not always be 100% accurate.