Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry
In an effort to find a non-contact technique capable of providing measurements of in-plane strain, the authors designed a speckle shearing interferometer using symmetrical coherent illumination. It is presented the analysis of the sensitivity to displacement and strain of this interferometer, togeth...
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Main Authors: | Juan F. Roman, Vicente Moreno, Jon Petzing, John Tyrer |
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Format: | Default Article |
Published: |
2005
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Subjects: | |
Online Access: | https://hdl.handle.net/2134/3638 |
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