Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry

In an effort to find a non-contact technique capable of providing measurements of in-plane strain, the authors designed a speckle shearing interferometer using symmetrical coherent illumination. It is presented the analysis of the sensitivity to displacement and strain of this interferometer, togeth...

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Bibliographic Details
Main Authors: Juan F. Roman, Vicente Moreno, Jon Petzing, John Tyrer
Format: Default Article
Published: 2005
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Online Access:https://hdl.handle.net/2134/3638
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