Analysis of coherent symmetrical illumination for electronic speckle pattern shearing interferometry

In an effort to find a non-contact technique capable of providing measurements of in-plane strain, the authors designed a speckle shearing interferometer using symmetrical coherent illumination. It is presented the analysis of the sensitivity to displacement and strain of this interferometer, togeth...

Full description

Saved in:
Bibliographic Details
Main Authors: Juan F. Roman, Vicente Moreno, Jon Petzing, John Tyrer
Format: Default Article
Published: 2005
Online Access:
Tags: Add Tag
No Tags, Be the first to tag this record!