Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure
Characterisation of Cadmium Telluride (CdTe) thin films commonly requires the use of invasive techniques for the identification of their structural growth and the detection of defects which occur during the deposition process. Structural growth and the presence of defects can affect the performance...
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| Main Authors: | , , , , , |
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| Format: | Default Article |
| Published: |
2015
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| Subjects: | |
| Online Access: | https://hdl.handle.net/2134/19447 |
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