Evaluation of effective carrier lifetime of CdTe solar cells using transient photovoltage decay measurements

A transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and measurements were conducted on several CdTe solar cells. The extracted effective carrier lifetimes were around 100ns. The effect of external illumination biasing was investigated and was found to reduc...

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Bibliographic Details
Main Authors: Vincent Tsai, George Koutsourakis, Martin Bliss, Tom Betts, Ralph Gottschalg
Format: Default Conference proceeding
Published: 2017
Subjects:
Online Access:https://hdl.handle.net/2134/25344
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