A modelling approach for long-term degradation of thin film silicon photovoltaic modules

This paper introduces a new concept of approach for modelling the ageing behaviour of a-Si PV modules with voltage-dependent photocurrent. The basis is the equivalent circuit of a PV module, specifically the modified single diode model. The parameters are extracted from I-V measurements. Ageing is t...

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Bibliographic Details
Main Authors: Jiang Zhu, K. Astawa, Thomas R. Betts, Ralph Gottschalg
Format: Default Conference proceeding
Published: 2010
Online Access:https://hdl.handle.net/2134/8167
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