Spatially and spectrally resolved electroluminescence measurement system for PV characterisation

A system that combines the advantages of fast global electroluminescence (EL) measure-ments and highly detailed spectral EL meas-urements is presented. A Si camera-based EL system is used to measure the intensity of radi-ative recombination of the PV device spatially resolved over its full area. A m...

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Bibliographic Details
Main Authors: Martin Bliss, Xiaofeng Wu, Karl Bedrich, Tom Betts, Ralph Gottschalg
Format: Default Conference proceeding
Published: 2014
Subjects:
Online Access:https://hdl.handle.net/2134/16186
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