Optical microscopy for engineering measurement - numbers with confidence
The demand for surface metrology has been increasing over several decades, with industrial requirements for quantification of structured and randomly rough surface features. This has been matched by the development of a range of dedicated non-contact microscope based techniques for three-dimensional...
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| Format: | Default Conference proceeding |
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2014
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| Online Access: | https://hdl.handle.net/2134/15552 |
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