Crystallographic structure and mechanical behaviour of SnAgCu solder interconnects under a constant loading rate

With the continuing increase of the integration density in electronics, dimensions of interconnections for electronic components have been miniaturized to a scale that is comparable to those of their crystallographic structure. For instance, a SnAgCu solder joint in the flip chip package can contain...

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Bibliographic Details
Main Authors: Jicheng Gong, Changqing Liu, Paul Conway, Vadim Silberschmidt
Format: Default Conference proceeding
Published: 2007
Subjects:
Online Access:https://hdl.handle.net/2134/5339
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