A big data MapReduce framework for fault diagnosis in cloud-based manufacturing

This research develops a MapReduce framework for automatic pattern recognition based on fault diagnosis by solving data imbalance problem in a cloud-based manufacturing (CBM). Fault diagnosis in a CBM system significantly contributes to reduce the product testing cost and enhances manufacturing qual...

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Bibliographic Details
Main Authors: Ajay Kumar, Ravi Shankar, Alok Choudhary, Lakshman S. Thakur
Format: Default Article
Published: 2016
Online Access:https://hdl.handle.net/2134/23087
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