Scattering and three-dimensional imaging in surface topography measuring interference microscopy
Surface topography measuring interference microscopy is a three-dimensional (3D) imaging technique that provides quantitative analysis of industrial and biomedical specimens. Many different instrument modalities and configurations exist, but they all share the same theoretical foundation. In this pa...
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Main Authors: | , , , |
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Format: | Default Article |
Published: |
2021
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Subjects: | |
Online Access: | https://hdl.handle.net/2134/14332934.v1 |
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