Pinhole-array-based hyperspectral interferometry for single-shot profilometry and depth-resolved displacement measurements
Surface profile and topography measurements of manufactured goods and components across all sectors of engineering are an integral component of a production process. Control measurements are taken on a regular basis to ensure items fulfil the required quality standards. Recent industry developments...
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Format: | Default Thesis |
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2020
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Online Access: | https://dx.doi.org/10.26174/thesis.lboro.13259174.v1 |
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