Se profiles in CST films formed by annealing CdTe/CdSe bi-layers

Se profiles in CST (CdSe X Te 1-x ) films formed by annealing CdTe/CdSe bilayers has been studied using transmission electron microscopy (TEM) and photoluminescence (PL). The effect of CdSe layer thickness and CdCl 2 annealing conditions on the alloy layer were investigated. The CdSe thickness was v...

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Bibliographic Details
Main Authors: Shamara Collins, Chih An Hsu, Vasilios Palekis, Ali Abbas, Michael Walls, Chris Ferekides
Format: Default Conference proceeding
Published: 2018
Subjects:
Online Access:https://hdl.handle.net/2134/11673519.v1
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