Se profiles in CST films formed by annealing CdTe/CdSe bi-layers
Se profiles in CST (CdSe X Te 1-x ) films formed by annealing CdTe/CdSe bilayers has been studied using transmission electron microscopy (TEM) and photoluminescence (PL). The effect of CdSe layer thickness and CdCl 2 annealing conditions on the alloy layer were investigated. The CdSe thickness was v...
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Main Authors: | , , , , , |
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Format: | Default Conference proceeding |
Published: |
2018
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Subjects: | |
Online Access: | https://hdl.handle.net/2134/11673519.v1 |
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