Effects of radiation on materials. Roger E. Stoller, Arvind S. Kumar, and David S. Gelles, editors. 15th international symposium

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Bibliographic Details
Corporate Authors: International Symposium on the Effects of Radiation on Materials. Nashville, Tenn., ASTM Committee E-10 on Nuclear Technology and Applications, American Society for Testing and Materials
Other Authors: Stoller, R. E., (Roger E.), 1951- (ed.), Kumar, A. S., (Arvind S.) (ed.), Gelles, D. S. (ed.)
Format: eBook
Language:English
Published: Philadelphia, Pa. : American Society for Testing and Materials, c1992.
Series:Journal of ASTM International. Selected technical papers ; STP 1125.
Subjects:
Online Access:https://compass.astm.org/document/?contentCode=ASTM%7CSTP1125-EB%7Cen-US&proxycl=https%3A%2F%2Fsecure.astm.org&fromLogin=true
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111 2 |a International Symposium on the Effects of Radiation on Materials.   |n (15th :  |d 1990 :   |c Nashville, Tenn.) 
245 1 0 |a Effects of radiation on materials.   |n 15th international symposium   |h [electronic resource] /   |c Roger E. Stoller, Arvind S. Kumar, and David S. Gelles, editors. 
260 |a Philadelphia, Pa. :   |b American Society for Testing and Materials,   |c c1992. 
300 |a xvi, [1], 3-1323 p. :   |b ill., charts, diagrs., tables. 
490 1 |a ASTM STP ;   |v 1125 
500 |a "ASTM Publication Code No. (PCN) 04-011250-35." 
504 |a Includes bibliographical references and indexes. 
506 |a Login to VPN Client for off campus access. 
650 0 |a Materials   |x Effect of radiation on   |v Congresses. 
650 0 |a Steel   |x Effect of radiation on   |v Congresses. 
650 0 |a Microstructure   |v Congresses. 
650 0 |a Metals   |x Effect of radiation on   |v Congresses. 
700 1 |a Stoller, R. E.,   |q (Roger E.),   |d 1951-,   |e ed. 
700 1 |a Kumar, A. S.,   |q (Arvind S.),   |e ed. 
700 1 |a Gelles, D. S.,   |e ed. 
710 2 |a ASTM Committee E-10 on Nuclear Technology and Applications. 
710 2 |a American Society for Testing and Materials. 
830 0 |a Journal of ASTM International.   |p Selected technical papers ;   |v STP 1125. 
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