Logic testing and design for testability Hideo Fujiwara.

Logic testing and design for testability Hideo Fujiwara.

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Bibliographic Details
Main Author: Fujiwara, Hideo
Format: eBook
Language:English
Published: Cambridge, Mass. ; : MIT Press, c1985.
Series:MIT Press series in computer systems
Subjects:
Logic circuits > Testing.
Electronic digital computers > Testing.
Logic design.
Online Access:http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
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http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264

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Copy [B447034] Available

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