Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach / Yichuang Sun (ed.).

Test and diagnosis of analogue, mixed-signal and RF integrated circuits the system on chip approach / Yichuang Sun (ed.). the system on chip approach /

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Bibliographic Details
Corporate Author:	Institution of Engineering and Technology
Other Authors:	Sun, Yichuang
Format:	eBook
Language:	English
Published:	Stevenage : IET, 2008.
Series:	Circuits, Devices and Systems Series 19
Subjects:	Application-specific integrated circuits. Integrated circuits > Testing. Linear integrated circuits. Systems on a chip. Testing.
Online Access:	http://dx.doi.org/10.1049/PBCS019E
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