VLSI testing : digital and mixed analogue/digital techniques / S.L. Hurst.

VLSI testing : digital and mixed analogue/digital techniques / S.L. Hurst. digital and mixed analogue/digital techniques /

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Bibliographic Details
Main Author: Hurst, Stanley L.
Corporate Author: Institution of Electrical Engineers
Format: eBook
Language:English
Published: Stevenage : IET, 1998.
Series:IEE Circuits, Devices and Systems Series 9
Subjects:
Application > Specific integrated circuits.
Integrated circuits > Testing.
Integrated circuits > Very large scale integration.
Signal processing.
Online Access:http://dx.doi.org/10.1049/PBCS009E
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ISBN:9781849191654

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