Advanced scanning electron microscopy and x-ray microanalysis / Dale E. Newbury ... [et al.].

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Bibliographic Details
Other Authors: Newbury, Dale E.
Format: Book
Language:English
Published: New York ; London : Plenum, c1986.
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sem 1
Description
Physical Description:xii,454p.,[4]p. of plates : ill.(some col.) ; 24cm.
Bibliography:Bibliography: p435-448. - Includes index.
ISBN:0306421402
9780306421402