Proceedings of the 17th Asian Test Symposium November 24-27, 2008 Sapporo, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC) ... [et al.].

Proceedings of the 17th Asian Test Symposium November 24-27, 2008 Sapporo, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC) ... [et al.]. November 24-27, 2008 Sapporo, Japan /

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Bibliographic Details
Corporate Authors: Asian Test Symposium Sapporo, Japan, IEEE Computer Society. Technical Council on Test Technology
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2008.
Subjects:
Electronic digital computers > Circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4711536
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