APA Edition Citation

Symposium on Reliable Distributed Systems Leeds, England, IEEE Computer Society, IEEE Computer Society. TC on Distributed Processing, University of Leeds. School of Computing, & IFIP Working Group 10.4 on Dependable Computing and Fault Tolerance. (2006). 25th IEEE Symposium on Reliable Distributed Systems SRDS 2006 : proceedings :2-4 October 2006, Leeds, United Kingdom / sponsored by IEEE Computer Society Technical Committee on Distributed Processing ; supported by School of Computing, Leeds University ; in cooperation with IFIP WG 10.4 on Dependable Computing and Fault Tolerance: SRDS 2006 : proceedings :2-4 October 2006, Leeds, United Kingdom (25th anniversary ed.). IEEE Computer Society.

Chicago Edition Citation

Symposium on Reliable Distributed Systems Leeds, England, IEEE Computer Society, IEEE Computer Society. TC on Distributed Processing, University of Leeds. School of Computing, and IFIP Working Group 10.4 on Dependable Computing and Fault Tolerance. 25th IEEE Symposium on Reliable Distributed Systems SRDS 2006 : Proceedings :2-4 October 2006, Leeds, United Kingdom / Sponsored by IEEE Computer Society Technical Committee on Distributed Processing ; Supported by School of Computing, Leeds University ; in Cooperation with IFIP WG 10.4 on Dependable Computing and Fault Tolerance: SRDS 2006 : Proceedings :2-4 October 2006, Leeds, United Kingdom. 25th anniversary ed. Los Alamitos, Calif.: IEEE Computer Society, 2006.

MLA Edition Citation

Symposium on Reliable Distributed Systems Leeds, England, et al. 25th IEEE Symposium on Reliable Distributed Systems SRDS 2006 : Proceedings :2-4 October 2006, Leeds, United Kingdom / Sponsored by IEEE Computer Society Technical Committee on Distributed Processing ; Supported by School of Computing, Leeds University ; in Cooperation with IFIP WG 10.4 on Dependable Computing and Fault Tolerance: SRDS 2006 : Proceedings :2-4 October 2006, Leeds, United Kingdom. 25th anniversary ed. IEEE Computer Society, 2006.

Warning: These citations may not always be 100% accurate.