26th IEEE VLSI Test Symposium proceedings : San Diego, California, 27 April - 1 May 2008 / [sponsored by] IEEE Computer Society. proceedings : San Diego, California, 27 April - 1 May 2008 /
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Corporate Authors: | , , |
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Format: | eBook |
Language: | English |
Published: |
Los Alamitos, Calif. :
IEEE Computer Society,
c2008.
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Online Access: | http://ieeexplore.ieee.org/servlet/opac?punumber=4511672 |
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111 | 2 | |a IEEE VLSI Test Symposium |n (26th : |d 2008 : |c San Diego, Calif.) | |
245 | 1 | 0 | |a 26th IEEE VLSI Test Symposium |h [electronic resource] : |b proceedings : San Diego, California, 27 April - 1 May 2008 / |c [sponsored by] IEEE Computer Society. |
246 | 3 | |a Twenty sixth IEEE VLSI Test Symposium | |
246 | 3 | 0 | |a VLSI Test Symposium |
246 | 3 | |a VTS 2008 | |
246 | 1 | 8 | |a VTS 08 |
246 | 1 | |i Available from some providers with title: |a VLSI Test Symposium, 2008, VTS 2008, 26th IEEE | |
260 | |a Los Alamitos, Calif. : |b IEEE Computer Society, |c c2008. | ||
500 | |a "IEEE Computer Society Order Number P3123"--T.p. verso. | ||
500 | |a "BMS part no. CFP08029-PRT"--T.p. verso. | ||
650 | 0 | |a Integrated circuits |x Very large scale integration |x Testing |v Congresses. | |
710 | 2 | |a IEEE Computer Society. |b Test Technology Technical Committee. | |
710 | 2 | |a Institute of Electrical and Electronics Engineers. | |
856 | 4 | |u http://ieeexplore.ieee.org/servlet/opac?punumber=4511672 |4 Suppress | |
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