NDCS 2008 IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts / sponsored by IEEE Computer Society, IEEE Test Technology Technical Council. IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems : 29-30 September 2008, Cambridge, Massachusetts /

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Bibliographic Details
Corporate Authors: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems Cambridge, Mass., IEEE Computer Society. Technical Council on Test Technology
Format: eBook
Language:English
Published: [Piscataway, N.J.] : IEEE, c2008.
Subjects:
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4638314
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