Proceedings of 2008 International Conference on Condition Monitoring and Diagnosis CMD 2008, Beijing, China, April 21-24, 2008 / sponsored by IEEE ... [et al.] ; organized by Beijing Area Major Laboratory of High Voltage & EMC, North China Electric Power University. CMD 2008, Beijing, China, April 21-24, 2008 /

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Bibliographic Details
Corporate Authors: International Conference on Condition Monitoring and Diagnosis Beijing, China, Institute of Electrical and Electronics Engineers, Hua bei dian li da xue. Beijing Area Major Laboratory of High Voltage and EMC
Format: eBook
Language:English
Published: [Piscataway, N.J.] : IEEE, 2008.
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Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4560066
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