VLSI Design, Automation and Test, 2008, VLSI-DAT 2008, IEEE International Symposium on date, 23-25 April, 2008.

VLSI Design, Automation and Test, 2008, VLSI-DAT 2008, IEEE International Symposium on date, 23-25 April, 2008. date, 23-25 April, 2008.

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Bibliographic Details
Corporate Authors: International Symposium on VLSI Design, Automation, and Test Hsin-chu shih, Taiwan, Gong ye ji shu yan jiu yuan
Format: eBook
Language:English
Published: [Piscataway, N.J.] : IEEE Xplore, c2008.
Subjects:
Integrated circuits > Very large scale integration > Congresses.
Online Access:Access restricted to subscribers
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