VLSI Design, Automation and Test, 2008, VLSI-DAT 2008, IEEE International Symposium on date, 23-25 April, 2008. date, 23-25 April, 2008.

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Bibliographic Details
Corporate Authors: International Symposium on VLSI Design, Automation, and Test Hsin-chu shih, Taiwan, Gong ye ji shu yan jiu yuan
Format: eBook
Language:English
Published: [Piscataway, N.J.] : IEEE Xplore, c2008.
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Online Access:Access restricted to subscribers
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245 1 0 |a VLSI Design, Automation and Test, 2008, VLSI-DAT 2008, IEEE International Symposium on  |h [electronic resource] :  |b date, 23-25 April, 2008. 
246 3 0 |a VLSI-DAT 2008 
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500 |a "IEEE catalog number: CFP08847"--PDF copyright p. 
500 |a "The 2008 International Symposium on VLSI Design, Automation, and Test (2008 VLSI-DAT) organized by the Industrial Technology Research Institute of Taiwan, will take place in Hsinchu, Taiwan on April 23-25, 2008"--Foreword. 
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