Ninth International Symposium on Quality Electronic Design ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 / technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.].

Ninth International Symposium on Quality Electronic Design ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 / technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.]. ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 /

Show all versions (3)
Saved in:
Bibliographic Details
Corporate Authors: International Symposium on Quality Electronic Design San Jose, Calif., IEEE Electron Devices Society, IEEE Circuits and Systems Society, Synopsys (Firm)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2008.
Subjects:
Integrated circuits > Very large scale integration > Reliability > Congresses.
Integrated circuits > Very large scale integration > Design and construction > Congresses.
Integrated circuits > Very large scale integration > Computer-aided design > Congresses.
Integrated circuits > Very large scale integration > Testing > Quality control > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4479672
Tags: Add Tag
No Tags, Be the first to tag this record!
LEADER 02216cam a2200421Ia 4500
001 001206461
005 20190624152734.0
006 m
008 080604s2008 caua sb 101 0 eng d
007 cr||||||||||||
020 |z 9780769531175 
020 |z 0769531172 
040 |a AZU  |c AZU  |d IEEXO 
111 2 |a International Symposium on Quality Electronic Design  |n (9th :  |d 2008 :  |c San Jose, Calif.) 
245 1 0 |a Ninth International Symposium on Quality Electronic Design  |h [electronic resource] :  |b ISQED 2008 : proceedings : San Jose, California : 17-19 March 2008 /  |c technical sponsors, IEEE Electron Device[s] Society ; cooperating entities, IEEE EDS ... [et al.] ; corporate & media sponsors, Synopsys' ... [et al.]. 
246 3 0 |a 9th International Symposium on Quality Electronic Design 
246 3 0 |a International Symposium on Quality Electronic Design 
246 3 0 |a Quality Electronic Design 
246 3 0 |a ISQED 2008 
246 3 3 |a Proceedings of the 9th International Symposium on Quality Electronic Design 
246 3 4 |a Proceedings of the IEEE ISQED 2008 
246 3 4 |a IEEE ISQED 2008 
246 3 8 |a ISQED Proceedings 2008 
246 1 |i Available from some providers with title:  |a Quality Electronic Design, 2008, ISQED 2008, 9th International Symposium on 
260 |a Los Alamitos, Calif. :  |b IEEE Computer Society,  |c c2008. 
500 |a "IEEE Computer Society Order Number P3117"--T.p. verso. 
500 |a "www.isqed.org" -- Spine. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Reliability  |v Congresses. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Design and construction  |v Congresses. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Computer-aided design  |v Congresses. 
650 0 |a Integrated circuits  |x Very large scale integration  |x Testing  |x Quality control  |v Congresses. 
710 2 |a IEEE Electron Devices Society. 
710 2 |a IEEE Circuits and Systems Society. 
710 2 |a Synopsys (Firm) 
856 4 |u http://ieeexplore.ieee.org/servlet/opac?punumber=4479672  |4 Suppress 
940 |a PILKL  |b EB 
999 |c 479501  |d 479501 
952 |0 0  |1 0  |4 0  |7 0  |9 777818  |a ONLINE  |b ONLINE  |c EB  |d 2010-05-26  |l 0  |p B376807  |r 2018-02-01  |w 2018-02-01  |y ONLINE 

Similar Items