2006 IEEE International Reliability Physics Symposium proceedings 44th annual : March 26-30, 2006, San Jose McInery Convention Center / Hilton San Jose, San Jose, California / sponsored by IEEE Electron Devices Society and the IEEE Reliability Society.

2006 IEEE International Reliability Physics Symposium proceedings 44th annual : March 26-30, 2006, San Jose McInery Convention Center / Hilton San Jose, San Jose, California / sponsored by IEEE Electron Devices Society and the IEEE Reliability Society. 44th annual : March 26-30, 2006, San Jose McInery Convention Center / Hilton San Jose, San Jose, California /

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Bibliographic Details
Corporate Authors: International Reliability Physics Symposium San Jose, Calif., IEEE Electron Devices Society, IEEE Reliability Society, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: [Piscataway, N.J.] : IEEE, 2006.
Subjects:
Electronic apparatus and appliances > Reliability > Congresses.
Semiconductors > Reliability > Congresses.
Integrated circuits > Reliability > Congresses.
Online Access:http://ieeexplore.ieee.org/servlet/opac?punumber=4017118
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