Proceedings of the 15th Asian Test Symposium 20-23 November 2006, Fukuoka, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC), Technical Group on Dependable Computing, ISS, IEICE, Kyushu Institute of Technology.

Proceedings of the 15th Asian Test Symposium 20-23 November 2006, Fukuoka, Japan / sponsored by IEEE Computer Society Test Technology Council (TTTC), Technical Group on Dependable Computing, ISS, IEICE, Kyushu Institute of Technology. 20-23 November 2006, Fukuoka, Japan /

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Bibliographic Details
Corporate Authors: Asian Test Symposium Fukuoka-shi, Japan, IEEE Computer Society. Technical Council on Test Technology, Denshi Joho Tsushin Gakkai (Japan). Technical Group on Dependable Computing, Kyushu Kogyo Daigaku, IEEE Xplore (Online service)
Format: eBook
Language:English
Published: Los Alamitos, Calif. : IEEE Computer Society, c2006.
Subjects:
Electronic digital computers > Circuits > Testing > Congresses.
Electronic circuits > Testing > Congresses.
Fault-tolerant computing > Congresses.
Online Access:Connect to this title online; UW restricted
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