Lock-in thermography : basics and use for evaluating electronic devices and materials. basics and use for evaluating electronic devices and materials.
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| Main Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
Heidelberg ; London :
Springer,
c2010.
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| Edition: | 2nd ed. / |
| Series: | Springer series in advanced microelectronics ;
10. |
| Subjects: | |
| Tags: |
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Pilkington Library - Pilkington Main Collection
| Shelfmark: |
621.362/BRE |
|---|---|
| Copy [0403831407] | Available |