Computer manual to accompany pattern classification / David G. Stork and Elad Yom-Tov.

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Bibliographic Details
Main Author:	Stork, David G.
Other Authors:	Yom-Tov, Elad
Format:	Book
Language:	English
Published:	New York ; Chichester : Wiley, 2004.
Subjects:	Pattern recognition systems Statistical decision
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Description
Physical Description:	200 p. (pbk).
ISBN:	0471429775

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