Applied logistic regression / David W. Hosmer and Stanley Lemeshow.

Applied logistic regression / David W. Hosmer and Stanley Lemeshow.

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Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York ; Chichester : Wiley, 2000.
Edition:2nd ed.
Subjects:
Regression analysis
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Pilkington Library - Pilkington Main Collection

Shelfmark: 519.536/HOS
Copy [0402725913] Available
Copy [0402725921] Available

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