Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].
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| Other Authors: | |
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| Format: | Book |
| Language: | English |
| Published: |
New York :
Kluwer Academic/Plenum Publishers,
c2003.
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| Edition: | 3rd ed. |
| Subjects: | |
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Pilkington Library - Pilkington Main Collection
| Shelfmark: |
502.8/SCA |
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| Copy [0402680308] | Available |