Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir. pseudorandom techniques /

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Bibliographic Details
Main Author: Bardell, Paul H.
Other Authors: McAnney, William H., Savir, Jacob
Format: Book
Language:English
Published: New York ; Chichester : Wiley, c1987.
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Pilkington Library - Pilkington Main Collection

Shelfmark: 621.38173/BAR
Copy [0402629086] Available