Built-in test for VLSI : pseudorandom techniques / Paul H. Bardell, William H. McAnney, Jacob Savir. pseudorandom techniques /
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Other Authors: | , |
Format: | Book |
Language: | English |
Published: |
New York ; Chichester :
Wiley,
c1987.
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Pilkington Library - Pilkington Main Collection
Shelfmark: |
621.38173/BAR |
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Copy [0402629086] | Available |