IEEE transactions on device and materials reliability.

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Bibliographic Details
Corporate Authors: Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society, IEEE Reliability Society
Format: Serial
Language:English
Published: New York : IEEE.
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Pilkington Library - Serial

Shelfmark: 621.3/IEE
Notes: Vol. 1-3, 2001-2003.
Copy [0403267811] Available Vol.1-3 (2001-03):