Data-driven methods for fault detection and diagnosis in chemical processes / Evan Russell, Leo H. Chiang and Richard D. Braatz.
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| Main Author: | |
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| Other Authors: | , |
| Format: | Book |
| Language: | English |
| Published: |
London :
Springer,
c2000
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| Series: | Advances in industrial control,
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| Subjects: | |
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Pilkington Library - Pilkington Main Collection
| Shelfmark: |
660.281/RUS |
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| Copy [0402200837] | Available |