Digital circuit testing and testability / Parag K. Lala.
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| Main Author: | |
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| Format: | Book |
| Language: | English |
| Published: |
San Diego ; London :
Academic Press,
c1997
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| Subjects: | |
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Pilkington Library - Pilkington Main Collection
| Shelfmark: |
621.381537/LAL |
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| Copy [040145472X] | Available |