High-level test synthesis of digital VLSI circuits / Mike Tien-Chien Lee.

High-level test synthesis of digital VLSI circuits / Mike Tien-Chien Lee.

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Bibliographic Details
Main Author: Lee, Mike Tien-Chien
Format: Book
Language:English
Published: Boston, Mass. : Artech House, 1997
Series:Artech House solid-state technology library
Subjects:
Integrated circuits > Very large scale integration > Design and construction > Data processing
Integrated circuits > Very large scale integration > Testing > Data processing
Computer-aided design
Digital integratedcircuits > Testing > Data processing
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Pilkington Library - Pilkington Main Collection

Shelfmark: 621.38173/LEE
Copy [0401468755] Available

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