Photometric determination of traces of metals : general aspects / [by] E.B. Sandell, Hiroshi Onishi. general aspects /
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| Main Author: | |
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| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
New York ; Chichester (etc.) :
Wiley,
1978.
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| Edition: | 4th ed. |
| Series: | Chemical analysis ;
v.3, Pt 1 |
| Subjects: | |
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| Item Description: | 'A Wiley-Interscience publication' Previous ed.: in 1 vol. New York : London : Interscience, 1959 |
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| Physical Description: | xi,1085p : ill ; 24cm. |
| Bibliography: | Index |
| ISBN: | 0471030945 |