Microelectronic reliability [edited by] Emiliano Pollino. Vol.2, Integrity assessment and assurance /

Saved in:
Bibliographic Details
Other Authors: Pollino, Emiliano
Format: Book
Language:English
Published: Norwood, MA : Artech House, c1989
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!

Pilkington Library - Pilkington Main Collection

Shelfmark: 621.3817/MIC
Copy [040011674X] Available