Defect analysis in electron microscopy / (by) M.H. Loretto and R.E. Smallman.

Saved in:
Bibliographic Details
Main Author: Loretto, M. H.
Other Authors: Smallman, R. E. (Raymond Edward), 1929-
Format: Book
Language:English
Published: London : Chapman and Hall (etc.), 1975
Subjects:
Tags: Add Tag
No Tags, Be the first to tag this record!

Pilkington Library - Pilkington Main Collection

Call Number: 548.83/LOR
Copy [008525401] Available