Logic testing and design for testability / Hideo Fujiwara.

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Bibliographic Details
Main Author: Fujiwara, Hideo
Format: Book
Language:English
Published: Cambridge, Mass. ; London : MIT Press, c1985.
Series:MIT Press series in computer systems
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Pilkington Library - Pilkington Main Collection

Call Number: 621.381537/FUJ
Copy [028389801] Available