Development and exploitation of the slit method for the characterization of x-ray screen film combinations / by D. Hoeschen.

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Bibliographic Details
Main Author: Hoeschen, D.
Corporate Author: European Communities. Commission. Directorate General, Research and Development
Format: Book
Language:English
Published: European Communities, 1987
Series:BCR information: applied metrology; EUR 10964
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Pilkington Library - Pamphlet (P)

Call Number: 621.3673/HOE
Copy [029266801] Available