New perspective on passively quenched single photon avalanche diodes: effect of feedback on impact ionization

Single-photon avalanche diodes (SPADs) are primary devices in photon counting systems used in quantum cryptography, time resolved spectroscopy and photon counting optical communication. SPADs convert each photo-generated electron hole pair to a measurable current via an avalanche of impact ionizatio...

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Bibliographic Details
Published in:	Optics express 2012-01, Vol.20 (2), p.1512-1529
Main Authors:	Ramirez, David A, Hayat, Majeed M, Rees, Graham J, Jiang, Xudong, Itzler, Mark A
Format:	Article
Language:	eng
Subjects:	Computer Communication Networks - instrumentation Computer Security - instrumentation Computer Simulation Electronics - instrumentation Feedback Models, Theoretical Monte Carlo Method Optics and Photonics - instrumentation Optics and Photonics - methods Photons Quantum Theory Stochastic Processes
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Summary:	Single-photon avalanche diodes (SPADs) are primary devices in photon counting systems used in quantum cryptography, time resolved spectroscopy and photon counting optical communication. SPADs convert each photo-generated electron hole pair to a measurable current via an avalanche of impact ionizations. In this paper, a stochastically self-regulating avalanche model for passively quenched SPADs is presented. The model predicts, in qualitative agreement with experiments, three important phenomena that traditional models are unable to predict. These are: (1) an oscillatory behavior of the persistent avalanche current; (2) an exponential (memoryless) decay of the probability density function of the stochastic quenching time of the persistent avalanche current; and (3) a fast collapse of the avalanche current, under strong feedback conditions, preventing the development of a persistent avalanche current. The model specifically captures the effect of the load's feedback on the stochastic avalanche multiplication, an effect believed to be key in breaking today's counting rate barrier in the 1.55-μm detection window.
ISSN:	1094-4087 1094-4087