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Development of a Thin Film Magnetic Moment Reference Material

In this paper we present the development of a magnetic moment reference material for low moment magnetic samples. We first conducted an inter-laboratory comparison to determine the most useful sample dimensions and magnetic properties for common instruments such as vibrating sample magnetometers (VS...

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Published in:Journal of research of the National Institute of Standards and Technology 2008-01, Vol.113 (1), p.1-10
Main Authors: Pappas, D P, Halloran, S T, Owings, R R, da Silva, F C S
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creator Pappas, D P
Halloran, S T
Owings, R R
da Silva, F C S
description In this paper we present the development of a magnetic moment reference material for low moment magnetic samples. We first conducted an inter-laboratory comparison to determine the most useful sample dimensions and magnetic properties for common instruments such as vibrating sample magnetometers (VSM), SQUIDs, and alternating gradient field magnetometers. The samples were fabricated and then measured using a vibrating sample magnetometer. Their magnetic moments were calibrated by tracing back to the NIST YIG sphere, SRM 2853.
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fullrecord <record><control><sourceid>gale_pubme</sourceid><recordid>TN_cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_4654610</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><galeid>A242592201</galeid><sourcerecordid>A242592201</sourcerecordid><originalsourceid>FETCH-LOGICAL-c445t-d0054bffded918c017656a48189716593e2a96a2065b11bdb17604550d3b2913</originalsourceid><addsrcrecordid>eNpdkc1v1DAUxC1ERZfCjTOKOIHULM-fiQ8gVf2iUiuksgdulpO8bL1K7MVOKvjv62VLBbzLO8xPoxkNIW8oLBWw-uMmYlpSypcA7BlZMKpkWTEpnpMFBSFKVVXfD8nLlDaQTwn9ghyyCrSiUC_IpzO8xyFsR_RTEfrCFqs754sLN4zFjV17nFxb3ITf8i32GNG3mJUJo7PDK3LQ2yHh68d_RFYX56vTL-X118ur05PrshVCTmUHIEXT9x12mtYt0EpJZUVNa13luJojs1pZBko2lDZdkwEQUkLHG6YpPyKf97bbuRmxa3OYaAezjW608ZcJ1pl_Fe_uzDrcG6GkyD2zwftHgxh-zJgmM7rU4jBYj2FOhlY151wDVxl99x-6CXP0uZ1hVFQ1CNAZ-rCH1nZA43wb_IQ_p7WdUzJX327NCRNMasZgF_54z7YxpBSxf8pNwewWNLsFTV7Q5AUz_vbvrk_wn8n4A90MlJo</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>214780409</pqid></control><display><type>article</type><title>Development of a Thin Film Magnetic Moment Reference Material</title><source>Open Access: PubMed Central</source><source>Publicly Available Content Database</source><creator>Pappas, D P ; Halloran, S T ; Owings, R R ; da Silva, F C S</creator><creatorcontrib>Pappas, D P ; Halloran, S T ; Owings, R R ; da Silva, F C S</creatorcontrib><description>In this paper we present the development of a magnetic moment reference material for low moment magnetic samples. We first conducted an inter-laboratory comparison to determine the most useful sample dimensions and magnetic properties for common instruments such as vibrating sample magnetometers (VSM), SQUIDs, and alternating gradient field magnetometers. The samples were fabricated and then measured using a vibrating sample magnetometer. Their magnetic moments were calibrated by tracing back to the NIST YIG sphere, SRM 2853.</description><identifier>ISSN: 1044-677X</identifier><identifier>EISSN: 2165-7254</identifier><identifier>DOI: 10.6028/jres.113.002</identifier><identifier>PMID: 27096108</identifier><identifier>CODEN: JRITEF</identifier><language>eng</language><publisher>United States: National Institute of Standards and Technology</publisher><subject>Accuracy ; Cost control ; Dielectric films ; Error propagation ; Laboratories ; Magnetic materials ; Magnetic moment ; Magnetic properties ; Manufacturers ; Measurement ; Mechanical properties ; Standard deviation ; Thin films</subject><ispartof>Journal of research of the National Institute of Standards and Technology, 2008-01, Vol.113 (1), p.1-10</ispartof><rights>COPYRIGHT 2008 National Institute of Standards and Technology</rights><rights>Copyright Superintendent of Documents Jan/Feb 2008</rights><rights>2008</rights><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c445t-d0054bffded918c017656a48189716593e2a96a2065b11bdb17604550d3b2913</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.proquest.com/docview/214780409/fulltextPDF?pq-origsite=primo$$EPDF$$P50$$Gproquest$$Hfree_for_read</linktopdf><linktohtml>$$Uhttps://www.proquest.com/docview/214780409?pq-origsite=primo$$EHTML$$P50$$Gproquest$$Hfree_for_read</linktohtml><link.rule.ids>230,315,733,786,790,891,25783,27957,27958,37047,37048,44625,53827,53829,75483</link.rule.ids><backlink>$$Uhttps://www.ncbi.nlm.nih.gov/pubmed/27096108$$D View this record in MEDLINE/PubMed$$Hfree_for_read</backlink></links><search><creatorcontrib>Pappas, D P</creatorcontrib><creatorcontrib>Halloran, S T</creatorcontrib><creatorcontrib>Owings, R R</creatorcontrib><creatorcontrib>da Silva, F C S</creatorcontrib><title>Development of a Thin Film Magnetic Moment Reference Material</title><title>Journal of research of the National Institute of Standards and Technology</title><addtitle>J Res Natl Inst Stand Technol</addtitle><description>In this paper we present the development of a magnetic moment reference material for low moment magnetic samples. We first conducted an inter-laboratory comparison to determine the most useful sample dimensions and magnetic properties for common instruments such as vibrating sample magnetometers (VSM), SQUIDs, and alternating gradient field magnetometers. The samples were fabricated and then measured using a vibrating sample magnetometer. Their magnetic moments were calibrated by tracing back to the NIST YIG sphere, SRM 2853.</description><subject>Accuracy</subject><subject>Cost control</subject><subject>Dielectric films</subject><subject>Error propagation</subject><subject>Laboratories</subject><subject>Magnetic materials</subject><subject>Magnetic moment</subject><subject>Magnetic properties</subject><subject>Manufacturers</subject><subject>Measurement</subject><subject>Mechanical properties</subject><subject>Standard deviation</subject><subject>Thin films</subject><issn>1044-677X</issn><issn>2165-7254</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2008</creationdate><recordtype>article</recordtype><sourceid>PIMPY</sourceid><recordid>eNpdkc1v1DAUxC1ERZfCjTOKOIHULM-fiQ8gVf2iUiuksgdulpO8bL1K7MVOKvjv62VLBbzLO8xPoxkNIW8oLBWw-uMmYlpSypcA7BlZMKpkWTEpnpMFBSFKVVXfD8nLlDaQTwn9ghyyCrSiUC_IpzO8xyFsR_RTEfrCFqs754sLN4zFjV17nFxb3ITf8i32GNG3mJUJo7PDK3LQ2yHh68d_RFYX56vTL-X118ur05PrshVCTmUHIEXT9x12mtYt0EpJZUVNa13luJojs1pZBko2lDZdkwEQUkLHG6YpPyKf97bbuRmxa3OYaAezjW608ZcJ1pl_Fe_uzDrcG6GkyD2zwftHgxh-zJgmM7rU4jBYj2FOhlY151wDVxl99x-6CXP0uZ1hVFQ1CNAZ-rCH1nZA43wb_IQ_p7WdUzJX327NCRNMasZgF_54z7YxpBSxf8pNwewWNLsFTV7Q5AUz_vbvrk_wn8n4A90MlJo</recordid><startdate>200801</startdate><enddate>200801</enddate><creator>Pappas, D P</creator><creator>Halloran, S T</creator><creator>Owings, R R</creator><creator>da Silva, F C S</creator><general>National Institute of Standards and Technology</general><general>Superintendent of Documents</general><general>[Gaithersburg, MD] : U.S. Dept. of Commerce, National Institute of Standards and Technology</general><scope>NPM</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>ISR</scope><scope>3V.</scope><scope>4S-</scope><scope>4T-</scope><scope>4U-</scope><scope>7XB</scope><scope>88I</scope><scope>8AF</scope><scope>8AO</scope><scope>8FE</scope><scope>8FG</scope><scope>8FK</scope><scope>8G5</scope><scope>ABJCF</scope><scope>ABUWG</scope><scope>AFKRA</scope><scope>AZQEC</scope><scope>BENPR</scope><scope>BGLVJ</scope><scope>BHPHI</scope><scope>BKSAR</scope><scope>CCPQU</scope><scope>D1I</scope><scope>DWQXO</scope><scope>GNUQQ</scope><scope>GUQSH</scope><scope>HCIFZ</scope><scope>KB.</scope><scope>M2O</scope><scope>M2P</scope><scope>MBDVC</scope><scope>PADUT</scope><scope>PCBAR</scope><scope>PDBOC</scope><scope>PIMPY</scope><scope>PQEST</scope><scope>PQQKQ</scope><scope>PQUKI</scope><scope>PRINS</scope><scope>Q9U</scope><scope>S0X</scope><scope>7X8</scope><scope>5PM</scope></search><sort><creationdate>200801</creationdate><title>Development of a Thin Film Magnetic Moment Reference Material</title><author>Pappas, D P ; Halloran, S T ; Owings, R R ; da Silva, F C S</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c445t-d0054bffded918c017656a48189716593e2a96a2065b11bdb17604550d3b2913</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2008</creationdate><topic>Accuracy</topic><topic>Cost control</topic><topic>Dielectric films</topic><topic>Error propagation</topic><topic>Laboratories</topic><topic>Magnetic materials</topic><topic>Magnetic moment</topic><topic>Magnetic properties</topic><topic>Manufacturers</topic><topic>Measurement</topic><topic>Mechanical properties</topic><topic>Standard deviation</topic><topic>Thin films</topic><toplevel>online_resources</toplevel><creatorcontrib>Pappas, D P</creatorcontrib><creatorcontrib>Halloran, S T</creatorcontrib><creatorcontrib>Owings, R R</creatorcontrib><creatorcontrib>da Silva, F C S</creatorcontrib><collection>PubMed</collection><collection>CrossRef</collection><collection>Gale In Context: Science</collection><collection>ProQuest Central (Corporate)</collection><collection>BPIR.com Limited</collection><collection>Docstoc</collection><collection>University Readers</collection><collection>ProQuest Central (purchase pre-March 2016)</collection><collection>Science Database (Alumni Edition)</collection><collection>STEM Database</collection><collection>ProQuest Pharma Collection</collection><collection>ProQuest SciTech Collection</collection><collection>ProQuest Technology Collection</collection><collection>ProQuest Central (Alumni) (purchase pre-March 2016)</collection><collection>Research Library (Alumni Edition)</collection><collection>Materials Science &amp; Engineering Collection</collection><collection>ProQuest Central (Alumni)</collection><collection>ProQuest Central</collection><collection>ProQuest Central Essentials</collection><collection>AUTh Library subscriptions: ProQuest Central</collection><collection>Technology Collection</collection><collection>ProQuest Natural Science Collection</collection><collection>Earth, Atmospheric &amp; Aquatic Science Collection</collection><collection>ProQuest One Community College</collection><collection>ProQuest Materials Science Collection</collection><collection>ProQuest Central Korea</collection><collection>ProQuest Central Student</collection><collection>Research Library Prep</collection><collection>SciTech Premium Collection (Proquest) (PQ_SDU_P3)</collection><collection>ProQuest Materials Science Database</collection><collection>Research Library (ProQuest)</collection><collection>ProQuest Science Journals</collection><collection>Research Library (Corporate)</collection><collection>Research Library China</collection><collection>ProQuest Earth, Atmospheric &amp; Aquatic Science Database</collection><collection>Materials Science Collection</collection><collection>Publicly Available Content Database</collection><collection>ProQuest One Academic Eastern Edition (DO NOT USE)</collection><collection>ProQuest One Academic</collection><collection>ProQuest One Academic UKI Edition</collection><collection>ProQuest Central China</collection><collection>ProQuest Central Basic</collection><collection>SIRS Editorial</collection><collection>MEDLINE - Academic</collection><collection>PubMed Central (Full Participant titles)</collection><jtitle>Journal of research of the National Institute of Standards and Technology</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Pappas, D P</au><au>Halloran, S T</au><au>Owings, R R</au><au>da Silva, F C S</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Development of a Thin Film Magnetic Moment Reference Material</atitle><jtitle>Journal of research of the National Institute of Standards and Technology</jtitle><addtitle>J Res Natl Inst Stand Technol</addtitle><date>2008-01</date><risdate>2008</risdate><volume>113</volume><issue>1</issue><spage>1</spage><epage>10</epage><pages>1-10</pages><issn>1044-677X</issn><eissn>2165-7254</eissn><coden>JRITEF</coden><notes>ObjectType-Article-1</notes><notes>SourceType-Scholarly Journals-1</notes><notes>ObjectType-Feature-2</notes><notes>content type line 23</notes><abstract>In this paper we present the development of a magnetic moment reference material for low moment magnetic samples. We first conducted an inter-laboratory comparison to determine the most useful sample dimensions and magnetic properties for common instruments such as vibrating sample magnetometers (VSM), SQUIDs, and alternating gradient field magnetometers. The samples were fabricated and then measured using a vibrating sample magnetometer. Their magnetic moments were calibrated by tracing back to the NIST YIG sphere, SRM 2853.</abstract><cop>United States</cop><pub>National Institute of Standards and Technology</pub><pmid>27096108</pmid><doi>10.6028/jres.113.002</doi><tpages>10</tpages><oa>free_for_read</oa></addata></record>
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ispartof Journal of research of the National Institute of Standards and Technology, 2008-01, Vol.113 (1), p.1-10
issn 1044-677X
2165-7254
language eng
recordid cdi_pubmedcentral_primary_oai_pubmedcentral_nih_gov_4654610
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subjects Accuracy
Cost control
Dielectric films
Error propagation
Laboratories
Magnetic materials
Magnetic moment
Magnetic properties
Manufacturers
Measurement
Mechanical properties
Standard deviation
Thin films
title Development of a Thin Film Magnetic Moment Reference Material
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-09-22T01%3A39%3A18IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-gale_pubme&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Development%20of%20a%20Thin%20Film%20Magnetic%20Moment%20Reference%20Material&rft.jtitle=Journal%20of%20research%20of%20the%20National%20Institute%20of%20Standards%20and%20Technology&rft.au=Pappas,%20D%20P&rft.date=2008-01&rft.volume=113&rft.issue=1&rft.spage=1&rft.epage=10&rft.pages=1-10&rft.issn=1044-677X&rft.eissn=2165-7254&rft.coden=JRITEF&rft_id=info:doi/10.6028/jres.113.002&rft_dat=%3Cgale_pubme%3EA242592201%3C/gale_pubme%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c445t-d0054bffded918c017656a48189716593e2a96a2065b11bdb17604550d3b2913%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=214780409&rft_id=info:pmid/27096108&rft_galeid=A242592201&rfr_iscdi=true