Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method

Abstract In this study, we conducted a quantitative evaluation of dislocation density by scanning electron microscopy electron channeling contrast imaging for α grains of a Ti-6Al-4V alloy deformed at room temperature. The depth of visibility of dislocations is experimentally measured as 140 to 160...

Full description

Saved in:
Bibliographic Details
Published in:Microscopy 2021-06, Vol.70 (3), p.265-277
Main Authors: Yamasaki, Shigeto, Deguchi, Misaki, Mitsuhara, Masatoshi, Nakashima, Hideharu, Ota, Yutaro, Kubushiro, Keiji
Format: Article
Language:English
Citations: Items that this one cites
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites cdi_FETCH-LOGICAL-c261t-6b1072b9f6b241c94bfb1992fff6dc806b4cfaa513eb50c355b904b1f4dad7b33
container_end_page 277
container_issue 3
container_start_page 265
container_title Microscopy
container_volume 70
creator Yamasaki, Shigeto
Deguchi, Misaki
Mitsuhara, Masatoshi
Nakashima, Hideharu
Ota, Yutaro
Kubushiro, Keiji
description Abstract In this study, we conducted a quantitative evaluation of dislocation density by scanning electron microscopy electron channeling contrast imaging for α grains of a Ti-6Al-4V alloy deformed at room temperature. The depth of visibility of dislocations is experimentally measured as 140 to 160 nm by a serial sectioning observation. This result is compared with the theoretical value and applied to evaluate dislocation density. These factors confirm that the theoretically calculated value of the depth of visibility, at 5 to 6 times the extinction distance, is valid for the hexagonal close-packed Ti alloy.
doi_str_mv 10.1093/jmicro/dfaa060
format article
fullrecord <record><control><sourceid>proquest_cross</sourceid><recordid>TN_cdi_proquest_miscellaneous_2448410718</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><oup_id>10.1093/jmicro/dfaa060</oup_id><sourcerecordid>2448410718</sourcerecordid><originalsourceid>FETCH-LOGICAL-c261t-6b1072b9f6b241c94bfb1992fff6dc806b4cfaa513eb50c355b904b1f4dad7b33</originalsourceid><addsrcrecordid>eNqFkD1PwzAQhi0EElXpyuwRhlA7cdxkrKryIRUxUFgj27FbV04cbKdSfwN_GoeUmVvu9N57d7oHgFuMHjAqs_mh0cLZea0YQxRdgEmKcpTkC4Qv_2paFtdg5v0BxShyjAidgO_1kZmeBW1baBWsZRf2v4X2xopRP2qvuTY6nKBu4fv6FUojRXCxJfasbaXR7Q4K2wbHfIC6YbtBiN6tTujSJOQTMmPsCfZ-aHjpNDMxiWH9oDQy7G19A64UM17OznkKPh7X29Vzsnl7elktN4lIKQ4J5RgtUl4qylOCRUm44rgsU6UUrUWBKCciYshxJnmORJbnvESEY0VqVi94lk3B3bi3c_arlz5UjfZCGsNaaXtfpYQUJN7ARbQ-jNYI13snVdW5-J87VRhVA_hqBF-dwceB-3HA9t1_3h9M5omQ</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype><pqid>2448410718</pqid></control><display><type>article</type><title>Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method</title><source>Oxford University Press Journals All Titles (1996-Current)</source><creator>Yamasaki, Shigeto ; Deguchi, Misaki ; Mitsuhara, Masatoshi ; Nakashima, Hideharu ; Ota, Yutaro ; Kubushiro, Keiji</creator><creatorcontrib>Yamasaki, Shigeto ; Deguchi, Misaki ; Mitsuhara, Masatoshi ; Nakashima, Hideharu ; Ota, Yutaro ; Kubushiro, Keiji</creatorcontrib><description>Abstract In this study, we conducted a quantitative evaluation of dislocation density by scanning electron microscopy electron channeling contrast imaging for α grains of a Ti-6Al-4V alloy deformed at room temperature. The depth of visibility of dislocations is experimentally measured as 140 to 160 nm by a serial sectioning observation. This result is compared with the theoretical value and applied to evaluate dislocation density. These factors confirm that the theoretically calculated value of the depth of visibility, at 5 to 6 times the extinction distance, is valid for the hexagonal close-packed Ti alloy.</description><identifier>ISSN: 2050-5698</identifier><identifier>EISSN: 2050-5701</identifier><identifier>DOI: 10.1093/jmicro/dfaa060</identifier><language>eng</language><publisher>UK: Oxford University Press</publisher><ispartof>Microscopy, 2021-06, Vol.70 (3), p.265-277</ispartof><rights>The Author(s) 2020. Published by Oxford University Press on behalf of The Japanese Society of Microscopy. All rights reserved. For permissions, please e-mail: journals.permissions@oup.com 2020</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><cites>FETCH-LOGICAL-c261t-6b1072b9f6b241c94bfb1992fff6dc806b4cfaa513eb50c355b904b1f4dad7b33</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>315,786,790,1591,27957,27958</link.rule.ids></links><search><creatorcontrib>Yamasaki, Shigeto</creatorcontrib><creatorcontrib>Deguchi, Misaki</creatorcontrib><creatorcontrib>Mitsuhara, Masatoshi</creatorcontrib><creatorcontrib>Nakashima, Hideharu</creatorcontrib><creatorcontrib>Ota, Yutaro</creatorcontrib><creatorcontrib>Kubushiro, Keiji</creatorcontrib><title>Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method</title><title>Microscopy</title><description>Abstract In this study, we conducted a quantitative evaluation of dislocation density by scanning electron microscopy electron channeling contrast imaging for α grains of a Ti-6Al-4V alloy deformed at room temperature. The depth of visibility of dislocations is experimentally measured as 140 to 160 nm by a serial sectioning observation. This result is compared with the theoretical value and applied to evaluate dislocation density. These factors confirm that the theoretically calculated value of the depth of visibility, at 5 to 6 times the extinction distance, is valid for the hexagonal close-packed Ti alloy.</description><issn>2050-5698</issn><issn>2050-5701</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2021</creationdate><recordtype>article</recordtype><recordid>eNqFkD1PwzAQhi0EElXpyuwRhlA7cdxkrKryIRUxUFgj27FbV04cbKdSfwN_GoeUmVvu9N57d7oHgFuMHjAqs_mh0cLZea0YQxRdgEmKcpTkC4Qv_2paFtdg5v0BxShyjAidgO_1kZmeBW1baBWsZRf2v4X2xopRP2qvuTY6nKBu4fv6FUojRXCxJfasbaXR7Q4K2wbHfIC6YbtBiN6tTujSJOQTMmPsCfZ-aHjpNDMxiWH9oDQy7G19A64UM17OznkKPh7X29Vzsnl7elktN4lIKQ4J5RgtUl4qylOCRUm44rgsU6UUrUWBKCciYshxJnmORJbnvESEY0VqVi94lk3B3bi3c_arlz5UjfZCGsNaaXtfpYQUJN7ARbQ-jNYI13snVdW5-J87VRhVA_hqBF-dwceB-3HA9t1_3h9M5omQ</recordid><startdate>20210606</startdate><enddate>20210606</enddate><creator>Yamasaki, Shigeto</creator><creator>Deguchi, Misaki</creator><creator>Mitsuhara, Masatoshi</creator><creator>Nakashima, Hideharu</creator><creator>Ota, Yutaro</creator><creator>Kubushiro, Keiji</creator><general>Oxford University Press</general><scope>AAYXX</scope><scope>CITATION</scope><scope>7X8</scope></search><sort><creationdate>20210606</creationdate><title>Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method</title><author>Yamasaki, Shigeto ; Deguchi, Misaki ; Mitsuhara, Masatoshi ; Nakashima, Hideharu ; Ota, Yutaro ; Kubushiro, Keiji</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c261t-6b1072b9f6b241c94bfb1992fff6dc806b4cfaa513eb50c355b904b1f4dad7b33</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2021</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Yamasaki, Shigeto</creatorcontrib><creatorcontrib>Deguchi, Misaki</creatorcontrib><creatorcontrib>Mitsuhara, Masatoshi</creatorcontrib><creatorcontrib>Nakashima, Hideharu</creatorcontrib><creatorcontrib>Ota, Yutaro</creatorcontrib><creatorcontrib>Kubushiro, Keiji</creatorcontrib><collection>CrossRef</collection><collection>MEDLINE - Academic</collection><jtitle>Microscopy</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Yamasaki, Shigeto</au><au>Deguchi, Misaki</au><au>Mitsuhara, Masatoshi</au><au>Nakashima, Hideharu</au><au>Ota, Yutaro</au><au>Kubushiro, Keiji</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method</atitle><jtitle>Microscopy</jtitle><date>2021-06-06</date><risdate>2021</risdate><volume>70</volume><issue>3</issue><spage>265</spage><epage>277</epage><pages>265-277</pages><issn>2050-5698</issn><eissn>2050-5701</eissn><notes>ObjectType-Article-1</notes><notes>SourceType-Scholarly Journals-1</notes><notes>ObjectType-Feature-2</notes><notes>content type line 23</notes><abstract>Abstract In this study, we conducted a quantitative evaluation of dislocation density by scanning electron microscopy electron channeling contrast imaging for α grains of a Ti-6Al-4V alloy deformed at room temperature. The depth of visibility of dislocations is experimentally measured as 140 to 160 nm by a serial sectioning observation. This result is compared with the theoretical value and applied to evaluate dislocation density. These factors confirm that the theoretically calculated value of the depth of visibility, at 5 to 6 times the extinction distance, is valid for the hexagonal close-packed Ti alloy.</abstract><cop>UK</cop><pub>Oxford University Press</pub><doi>10.1093/jmicro/dfaa060</doi><tpages>13</tpages></addata></record>
fulltext fulltext
identifier ISSN: 2050-5698
ispartof Microscopy, 2021-06, Vol.70 (3), p.265-277
issn 2050-5698
2050-5701
language eng
recordid cdi_proquest_miscellaneous_2448410718
source Oxford University Press Journals All Titles (1996-Current)
title Evaluation of depth of dislocation visibility in SEM electron channeling contrast imaging in Ti-6Al-4V alloy using serial sectioning method
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-09-21T13%3A55%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-proquest_cross&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Evaluation%20of%20depth%20of%20dislocation%20visibility%20in%20SEM%20electron%20channeling%20contrast%20imaging%20in%20Ti-6Al-4V%20alloy%20using%20serial%20sectioning%20method&rft.jtitle=Microscopy&rft.au=Yamasaki,%20Shigeto&rft.date=2021-06-06&rft.volume=70&rft.issue=3&rft.spage=265&rft.epage=277&rft.pages=265-277&rft.issn=2050-5698&rft.eissn=2050-5701&rft_id=info:doi/10.1093/jmicro/dfaa060&rft_dat=%3Cproquest_cross%3E2448410718%3C/proquest_cross%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-c261t-6b1072b9f6b241c94bfb1992fff6dc806b4cfaa513eb50c355b904b1f4dad7b33%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_pqid=2448410718&rft_id=info:pmid/&rft_oup_id=10.1093/jmicro/dfaa060&rfr_iscdi=true