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3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors
This paper presents 3-D simulation of angled strike heavy-ion induced charge collection in domestic silicon-germanium heterojunction bipolar transistors (SiGe HBTs). 3D damaged model of SiGe HBTs single-event effects (SEE) is built by TCAD simulation tools to research ions angled strike dependence....
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Published in: | Journal of semiconductors 2014-04, Vol.35 (4), p.56-61 |
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container_issue | 4 |
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container_title | Journal of semiconductors |
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creator | 张晋新 郭红霞 文林 郭旗 崔江维 王信 邓伟 郑齐文 范雪 肖尧 |
description | This paper presents 3-D simulation of angled strike heavy-ion induced charge collection in domestic silicon-germanium heterojunction bipolar transistors (SiGe HBTs). 3D damaged model of SiGe HBTs single-event effects (SEE) is built by TCAD simulation tools to research ions angled strike dependence. We select several different strike angles at variously typical ions strike positions. The charge collection mechanism for each terminal is identified based on analysis of the device structure and simulation results. Charge collection induced by angled strike ions presents a complex situation. Whether the location of device ions enters, as long as ions track through the sensitive volume, it will cause vast charge collection. The amount of charge collection of SiGe HBT is not only related to length of ions track in sensitive volume, but also influenced by STI and distance between ions track and electrodes. The simulation model is useful to research the practical applications of SiGe HBTs in space, and provides a theoretical basis for the further radiation hardening. |
doi_str_mv | 10.1088/1674-4926/35/4/044003 |
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We select several different strike angles at variously typical ions strike positions. The charge collection mechanism for each terminal is identified based on analysis of the device structure and simulation results. Charge collection induced by angled strike ions presents a complex situation. Whether the location of device ions enters, as long as ions track through the sensitive volume, it will cause vast charge collection. The amount of charge collection of SiGe HBT is not only related to length of ions track in sensitive volume, but also influenced by STI and distance between ions track and electrodes. The simulation model is useful to research the practical applications of SiGe HBTs in space, and provides a theoretical basis for the further radiation hardening.</description><identifier>ISSN: 1674-4926</identifier><identifier>DOI: 10.1088/1674-4926/35/4/044003</identifier><language>eng</language><subject>3-D ; Charge ; Collection ; Computer simulation ; Heterojunction bipolar transistors ; Semiconductors ; SiGe异质结双极晶体管 ; Silicon germanides ; Strikes ; Three dimensional ; 收集 ; 模拟 ; 电荷 ; 硅锗异质结双极晶体管 ; 诱导 ; 重离子</subject><ispartof>Journal of semiconductors, 2014-04, Vol.35 (4), p.56-61</ispartof><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c312t-f0fb3f5800579795260b2b7eb2e9cf8947e91a834051923eefb4e772077c55313</citedby><cites>FETCH-LOGICAL-c312t-f0fb3f5800579795260b2b7eb2e9cf8947e91a834051923eefb4e772077c55313</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Uhttp://image.cqvip.com/vip1000/qk/94689X/94689X.jpg</thumbnail><link.rule.ids>315,786,790,27957,27958</link.rule.ids></links><search><creatorcontrib>张晋新 郭红霞 文林 郭旗 崔江维 王信 邓伟 郑齐文 范雪 肖尧</creatorcontrib><title>3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors</title><title>Journal of semiconductors</title><addtitle>Chinese Journal of Semiconductors</addtitle><description>This paper presents 3-D simulation of angled strike heavy-ion induced charge collection in domestic silicon-germanium heterojunction bipolar transistors (SiGe HBTs). 3D damaged model of SiGe HBTs single-event effects (SEE) is built by TCAD simulation tools to research ions angled strike dependence. We select several different strike angles at variously typical ions strike positions. The charge collection mechanism for each terminal is identified based on analysis of the device structure and simulation results. Charge collection induced by angled strike ions presents a complex situation. Whether the location of device ions enters, as long as ions track through the sensitive volume, it will cause vast charge collection. The amount of charge collection of SiGe HBT is not only related to length of ions track in sensitive volume, but also influenced by STI and distance between ions track and electrodes. The simulation model is useful to research the practical applications of SiGe HBTs in space, and provides a theoretical basis for the further radiation hardening.</description><subject>3-D</subject><subject>Charge</subject><subject>Collection</subject><subject>Computer simulation</subject><subject>Heterojunction bipolar transistors</subject><subject>Semiconductors</subject><subject>SiGe异质结双极晶体管</subject><subject>Silicon germanides</subject><subject>Strikes</subject><subject>Three dimensional</subject><subject>收集</subject><subject>模拟</subject><subject>电荷</subject><subject>硅锗异质结双极晶体管</subject><subject>诱导</subject><subject>重离子</subject><issn>1674-4926</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNo9kD1PwzAQhjOARCn8BKSwsYTYsR3HIyqfUiUWmC3HvaQujt3aCVIlfjyJUnU63b3vc8OTJHcYPWJUVTkuOc2oKMqcsJzmiFKEyEWyON-vkusYdwiNO8WL5I9kz2k03WBVb7xLfZMq11rYpLEP5gfSLajfYzZFxm0GPQZ6q0ILqfbWgu7nZHxhjfYuS1sInXJm6Eayh-B3g5tLtdl7q0LaB-Wiib0P8Sa5bJSNcHuay-T79eVr9Z6tP98-Vk_rTBNc9FmDmpo0rEKIccEFK0pUFzWHugChm0pQDgKrilDEsCgIQFNT4LxAnGvGCCbL5GH-uw_-MEDsZWeiBmuVAz9EiUcXpai4mKpsrurgYwzQyH0wnQpHiZGcDMvJpJxMSsIklbPhkbs_cVvv2oNx7RmkglasrDj5B3sGfbE</recordid><startdate>20140401</startdate><enddate>20140401</enddate><creator>张晋新 郭红霞 文林 郭旗 崔江维 王信 邓伟 郑齐文 范雪 肖尧</creator><scope>2RA</scope><scope>92L</scope><scope>CQIGP</scope><scope>W92</scope><scope>~WA</scope><scope>AAYXX</scope><scope>CITATION</scope><scope>7SP</scope><scope>7U5</scope><scope>8FD</scope><scope>L7M</scope></search><sort><creationdate>20140401</creationdate><title>3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors</title><author>张晋新 郭红霞 文林 郭旗 崔江维 王信 邓伟 郑齐文 范雪 肖尧</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c312t-f0fb3f5800579795260b2b7eb2e9cf8947e91a834051923eefb4e772077c55313</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><topic>3-D</topic><topic>Charge</topic><topic>Collection</topic><topic>Computer simulation</topic><topic>Heterojunction bipolar transistors</topic><topic>Semiconductors</topic><topic>SiGe异质结双极晶体管</topic><topic>Silicon germanides</topic><topic>Strikes</topic><topic>Three dimensional</topic><topic>收集</topic><topic>模拟</topic><topic>电荷</topic><topic>硅锗异质结双极晶体管</topic><topic>诱导</topic><topic>重离子</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>张晋新 郭红霞 文林 郭旗 崔江维 王信 邓伟 郑齐文 范雪 肖尧</creatorcontrib><collection>中文科技期刊数据库</collection><collection>中文科技期刊数据库-CALIS站点</collection><collection>维普中文期刊数据库</collection><collection>中文科技期刊数据库-工程技术</collection><collection>中文科技期刊数据库- 镜像站点</collection><collection>CrossRef</collection><collection>Electronics & Communications Abstracts</collection><collection>Solid State and Superconductivity Abstracts</collection><collection>Technology Research Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Journal of semiconductors</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>张晋新 郭红霞 文林 郭旗 崔江维 王信 邓伟 郑齐文 范雪 肖尧</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors</atitle><jtitle>Journal of semiconductors</jtitle><addtitle>Chinese Journal of Semiconductors</addtitle><date>2014-04-01</date><risdate>2014</risdate><volume>35</volume><issue>4</issue><spage>56</spage><epage>61</epage><pages>56-61</pages><issn>1674-4926</issn><notes>SiGe heterojunction bipolar transistors; single-event effects; angled strike; three-dimensional numer-ical simulation</notes><notes>11-5781/TN</notes><notes>This paper presents 3-D simulation of angled strike heavy-ion induced charge collection in domestic silicon-germanium heterojunction bipolar transistors (SiGe HBTs). 3D damaged model of SiGe HBTs single-event effects (SEE) is built by TCAD simulation tools to research ions angled strike dependence. We select several different strike angles at variously typical ions strike positions. The charge collection mechanism for each terminal is identified based on analysis of the device structure and simulation results. Charge collection induced by angled strike ions presents a complex situation. Whether the location of device ions enters, as long as ions track through the sensitive volume, it will cause vast charge collection. The amount of charge collection of SiGe HBT is not only related to length of ions track in sensitive volume, but also influenced by STI and distance between ions track and electrodes. The simulation model is useful to research the practical applications of SiGe HBTs in space, and provides a theoretical basis for the further radiation hardening.</notes><notes>Zhang Jinxin, Guo Hongxia Wen Lin, Guo Qi, Cui Jiangwei, Wang Xin, Deng Wei, Zhen Qiwen Fan Xue , and Xiao Yao(1 Key Laboratory of Functional Materials and Devices for Special Environments ofCAS, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China 2Northwest Institution of Nuclear Technology, Xi' an 710024, China 3 University of Chinese Academy of Sciences, Beijing 100049, China 4State Key Laboratory of Electronic Thin Films and Integrated Device, University of Electronic Science and Technology of China, Chengdu 610054, China)</notes><notes>ObjectType-Article-1</notes><notes>SourceType-Scholarly Journals-1</notes><notes>ObjectType-Feature-2</notes><notes>content type line 23</notes><abstract>This paper presents 3-D simulation of angled strike heavy-ion induced charge collection in domestic silicon-germanium heterojunction bipolar transistors (SiGe HBTs). 3D damaged model of SiGe HBTs single-event effects (SEE) is built by TCAD simulation tools to research ions angled strike dependence. We select several different strike angles at variously typical ions strike positions. The charge collection mechanism for each terminal is identified based on analysis of the device structure and simulation results. Charge collection induced by angled strike ions presents a complex situation. Whether the location of device ions enters, as long as ions track through the sensitive volume, it will cause vast charge collection. The amount of charge collection of SiGe HBT is not only related to length of ions track in sensitive volume, but also influenced by STI and distance between ions track and electrodes. The simulation model is useful to research the practical applications of SiGe HBTs in space, and provides a theoretical basis for the further radiation hardening.</abstract><doi>10.1088/1674-4926/35/4/044003</doi><tpages>6</tpages></addata></record> |
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subjects | 3-D Charge Collection Computer simulation Heterojunction bipolar transistors Semiconductors SiGe异质结双极晶体管 Silicon germanides Strikes Three dimensional 收集 模拟 电荷 硅锗异质结双极晶体管 诱导 重离子 |
title | 3-D simulation of angled strike heavy-ion induced charge collection in silicon- germanium heterojunction bipolar transistors |
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